Metrology Lab Capabilities
Metrology Services We Offer
CMM Sales & Maintenance
TRAINING
Measurement Capabilities:
• CMM Touch Probe/Scanning Probe
• Optical/Vision Systems
• Laser Scanning
• CT Scanning
Accreditations:
ISO 17025 Certified Metrology Lab
ITAR Registered
ASME GDTP Senior Certifications
AUKOM Certified Metrologists
Lab Equipment List
Made to Measure, LLC aims to strengthen the capability & capacity of our partners. We provide accurate, timely, and reliable measurement services for purposeful inspections, CMM programs, training & more. Our range of of in-house equipment includes coordinate measuring machines in many sizes, laser scanners, Vision Systems, and more. See below for a list of our lab’s equipment with the maximum envelope size & accuracy.
Make/Model of Metrology Equipment | Maximum 3D Envelope Size* | Best Measurement Capability (Total uncertainty/Accuracy) |
---|---|---|
M2M Apache 6.10.5 CMM | 600mm(X) 1000mm(Y) 500mm(Z) | ± 2.5 + ( L /350 )/MPE(P) = 2.5µm |
B&S Global FX 7.7.7 CMM | 700mm(X) 700mm(Y) 700mm(Z) | ± 3.5 + ( L /200 )/MPE(P) = 2.5µm |
M2M Blackhawk 6.10.5 CMM | 600mm(X) 1000mm(Y) 500mm(Z) | ± 2.5 + ( L /350 )/MPE(P) = 2.5µm |
Starret RGDC 6460-40 CMM | 1600mm(X) 1500mm(Y) 1000mm(Z) | ± 3.5 + ( L /200 )/MPE(P) = 3.5µm |
B&S Excel 7.6.5 CMM | 700mm(X) 600mm(Y) 500mm(Z) | ± 3.5 + ( L /200 )/MPE(P) = 3.5µm |
Gantry DEA Alpha 20.50.15 CMM | 2000mm(X) 5000mm(Y) 1500mm(Z) | X=±.0042mm, Y=±.0030mm, Z=±.0029mm |
DCC Gage 2000 4.5.4 CMM | 400mm(X) 500mm(Y) 400mm(Z) | ± 3.5 + ( L /200 )/MPE(P) = 3.0µm |
M2M Comanche 10.10.8 CMM | 1000mm(X) 1000mm(Y) 800mm(Z) | ± 2.6 + ( L /200 )/MPE(P) = 2.4µm |
M2M Blackhawk 6.8.5 CMM | 600mm(X) 800mm(Y) 500mm(Z) | ± 2.7 + ( L /200 )/MPE(P) = 2.4µm |
B&S PFX DCC 4.5.4 CMM | 450mm(X) 500mm(Y) 400mm(Z) | ± 3.5 + ( L /200 )/MPE(P) = 3.5µm |
IMS Merlin 7.10.7 CMM | 700mm(X) 1000mm(Y) 700mm(Z) | ± 2.8+ ( L /200 )/MPE(P) = 3.0µm |
Mitutoyo PH-A14 Optical Comparator | 203mm(X) 101mm(Y) | Max Error: 0.00038(X), 0.00020(Y) |
RAM Optical Sprint 300 | 305mm(X) 305mm(Y) 157mm(Z) | Max Error: 0.00029(X), 0.00039(Y), 0.00085(Z) |
Micro-Vu Sol 161 | 157mm(X) 157mm(Y) 157mm(Z) | XY Accuracy – 2.8+L /150, Z Accuracy – 2.8+L/100, Scale Resolution – 1.0 μm |
Micro-Vu Excel 502HM | 406mm(X) 508mm(Y) 258mm(Z) | XY Accuracy – 3.1+L /200, Z Accuracy – 3.3+L/100, Scale Resolution – 0.4 μm |
Jenoptik F50 Roundness | 300mm (X) 450mm (Z) | Roundness Error – 0.05+0.0005 µm, Axial run-out error – 0.05+0.0005 µm, Centering range – ±2 mm |
Renishaw Equator | XY – Ø300 mm, Z – 150 mm | Comparison uncertainty – ±0.002 mm, Scale resolution – 0.0002 mm |
*30% more space available in XY direction for physical part size